Sensors for Optiv
Sensors for Optiv
The advantages of multisensor technology. Through the combination of contact and non-contact measuring sensors, Optiv measuring machines bundle the advantages of several sensors into a single multisensor system. It is now possible to carry out a wide range of different measuring tasks on a part using the sensor most suitable for each task – in one clamping operation and a single measurement process. Multisensor technology largely removes the need to invest in a host of different measuring machines. The modular design of the systems also leaves open all possibilities for future measuring tasks.


Vision sensor


The vision sensor is the image-processing measurement sensor for Optiv measuring machines. It can perform non-contact measurements on the smallest features subject to the tightest tolerances, accomplishing the sort of tasks that could not be accomplished with a probe, while avoiding deformations of the inspected part often caused by mechanical probes. The object being measured is captured through the lens on a matrix camera (CCD camera). The optical signals are converted into a digital image and further processed to calculate the coordinates of the measured points by the imaging processing routines in the PC-DMIS Vision measurement software package.


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Through-The-Lens laser (TTL laser)


The TTL laser and the image-processing vision sensor share one and the same optical path ("Through-The-Lens"). This coaxial principle allows seamless switching between camera and laser. As this concept does not involve an offset between the two sensors, no loss of measuring range in the X-direction occurs and calibration is minimised.


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Chromatic white light sensor (CWS)


The chromatic white light sensor (CWS) is a highly efficient scanning sensor. It is based on the confocal measurement principle and works using chromatic depth scanning. This technique uses a special lens that refracts white light differentially depending on its wavelength in order to carry out distance measurements. The system resolution therefore depends on the intensity of the light reflected from the surface of the inspected part.


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